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United States Patent 5,808,268
Balz, et. al. Sept. 15, 1998

Method for marking substrates

Abstract

A method for marking a surface with high-density indicia comprising the steps of providing a marking device, providing input data defining indicia to be marked on the surface wherein the indicia comprises characters and the input data further defines a font for each character of the indicia, determining pixels for each character in accordance with the font, forming raster lines in accordance with the pixels, and traversing each raster line with the marking device to mark the surface according to the pixels of the raster line. If a laser is used as the marking device, the laser may need time to recharge in between marking closely spaced pixels. Thus, the laser may pass over certain pixels while the laser is recharging. Therefore, the laser may have to make an additional pass over the raster line to mark the pixels that were skipped over while the laser was recharging.


Inventors: Balz; James G. (Maybrook, NY); LaPlante; Mark J. (Walden, NY); Long; David C. (Wappingers Falls, NY); Peterson; Brenda L. (Wappingers Falls, NY).
Assignee: International Business Machines Corporation (Armonk, NY).
Appl. No.: 686,239
Filed: Jul. 23, 1996
Intl. Cl. : B23K 26/00
Current U.S. Cl.: 219/121.8
Field of Search: 219/121.8, 121.76, 121.77, 121.81, 121.68, 121.69; 345/471

References Cited | [Referenced By]

U.S. Patent Documents
3,925,785Dec., 1975Firtion et al.
4,564,739Jan., 1986Mattelin
4,594,674Jun., 1986Boulia et al. 345/471
4,636,043Jan., 1987Bellar 219/121.68
4,652,722Mar., 1987Stone et al.
4,727,235Feb., 1988Stamer et al. 219/121.68
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5,229,574Jul., 1993Stone 219/121.68
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5,260,542Nov., 1993Ishiguro et al. 219/121.68
5,294,774Mar., 1994Stone
5,309,273May, 1994Mori et al. 219/121.68
5,329,090Jul., 1994Woelki et al. 219/121.68

Foreign Patent Documents
0 472 049 A2Feb., 1992EP
WO 92/09399Jun., 1992WO
Other References

SPIE, Advances in Laser Engineering and Applications, "Neodymium yttrium aluminum garnet (Nd: YAG) laser marking system", by R.L. Hansen, vol. 247, pp. 18-23 (1980).

Semiconductor International, "Laser Marking of Plastic Components", by Koller et al., p. 106, Jun. (1991).


Primary Examiner: Evans; Geoffrey S.
Attorney, Agent or Firm: DeLio & Peterson, LLCPeterson; Peter W., Ahsan; Aziz M.
15 Claims, 2 Drawing Figures

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