[Back to the Laser Materials Processing Patent Collection]
United States Patent 6,437,284
Okamoto ,   et al. August 20, 2002

Optical system and apparatus for laser heat treatment and method for producing semiconductor devices by using the same

Abstract

An optical system that controls laser beam spot profile for forming a high performance thin film by a laser heat treatment process is provided. In the optical system that irradiates a rectangular laser beam on a film formed on a substrate, intensity distribution forming, apparatus makes the intensity distribution uniform in the longitudinal direction while maintaining the properties of the laser beam 2 such as directivity in the direction of shorter side, making it possible to concentrate the light to a limit permitted by the nature of the laser beam and achieve the maximum intensity gradient on the film disposed on the substrate. Thus a steep temperature distribution can be generated on the film disposed on the substrate and, as a result, high performance thin film can be formed.


Inventors: Okamoto; Tatsuki (Tokyo, JP); Ogawa; Tetsuya (Tokyo, JP); Furuta; Keisuke (Tokyo, JP); Tokioka; Hidetada (Tokyo, JP); Sasagawa; Tomohiro (Tokyo, JP); Nishimae; Junichi (Tokyo, JP); Inoue; Mitsuo (Tokyo, JP); Sato; Yukio (Tokyo, JP)
Assignee: Mitsubishi Denki Kabushiki Kaisha (Tokyo, JP)
Appl. No.: 599645
Filed: June 23, 2000
Foreign Application Priority Data

Jun 25, 1999[JP]11-179233

Current U.S. Class: 219/121.73; 219/121.65; 438/487
Intern'l Class: B23K 026/06
Field of Search: 219/121.73,121.75,121.65,121.66,121.74 438/487


References Cited

U.S. Patent Documents
4315130Feb., 1982Inagaki et al.
4744615May., 1988Fan et al.
4793694Dec., 1988Liu219/121.
5529951Jun., 1996Noguchi et al.219/121.
5897799Apr., 1999Yamazaki et al.219/121.
6249385Jun., 2001Yamazaki et al.
Foreign Patent Documents
61-61657Dec., 1986JP.
63-314862Dec., 1988JP.
4-33791Feb., 1992JP.
10-333077Dec., 1998JP.
11-16851Jan., 1999JP.


Other References

J. Carvalho et al.; "Nd-YAG Laser Induced Crystallization on a-Si:H Thin Films", Mat. Soc. Symp. Proc., vol. 358, pp. 915-920 (1995).
B. Rezek et al.; "Polycrystalline Silicon Thin Films Produced by Interference Laser Crystallization of Amorphous Silicon", Jpn. J. Appl. Phys., vol. 38, pp. L1083-L1084 (1999).

Primary Examiner: Evans; Geoffrey S.
Attorney, Agent or Firm: Leydig, Voit & Mayer, Ltd.

[Back to the Laser Materials Processing Patent Collection]